Cart
9
Product
Products
$315.90
(empty)
-
1 x SAE J 1746...$35.10 -
1 x SAE J 2375...$35.10 -
1 x BS EN IEC...$35.10 -
1 x BS EN...$35.10 -
1 x TS 128 510...$35.10 -
1 x TS 128 523...$35.10 -
1 x AAMA 300 :...$35.10 -
1 x TS 128 511...$35.10 -
1 x TS 128 301...$35.10
No products
$7.00
Shipping
$322.90
Total
Product successfully added to your shopping cart
Quantity
Total
There are 9 items in your cart.
There is 1 item in your cart.
Total products
$315.90
Total shipping
$7.00
Total
$322.90
New
Reduced price!
View larger
View larger
BS IEC 63068-1:2019
M00012391
New product
BS IEC 63068-1:2019
Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices – Part 1: Classification of defects
British Standards Institution
In stock
More info
Abstract
This part of IEC 63068 gives a classification of defects in as-grown 4H-SiC (Silicon Carbide) epitaxial layers.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | British Standards Institution |
| Committee | EPL/47 |