Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Product categories and applications<br>5 Failure<br>6 Reliability test<br>7 Stress test methods<br>8 Supplementary tests<br>9 Summary table of assumptions<br>10 Summary<br>Bibliography<br>Annex ZA (normative) - Normative references to<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;international publications with their<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;corresponding European publications

Abstract

Provides guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	British Standards Institution
Pages
ISBN
Committee	EPL/47
Supersedes	15/30269562 DC : 0