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BS EN 62435-2 : 2017

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BS EN 62435-2 : 2017

ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2: DETERIORATION MECHANISMS

British Standards Institution

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Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and abbreviated terms<br>4 Principles of deterioration<br>5 Technical validation of the components<br>Annex A (normative) - Failure mechanisms - Encapsulated and<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;non-encapsulated active components<br>Bibliography<br>Annex ZA (normative) - Normative references to<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;international publications with their<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;corresponding European publications

Abstract

Defines to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47
Supersedes
  • 13/30286163 DC : 0