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IEC 62047-29 : 1ED 2017

M00030660

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IEC 62047-29 : 1ED 2017

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 29: ELECTROMECHANICAL RELAXATION TEST METHOD FOR FREESTANDING CONDUCTIVE THIN-FILMS UNDER ROOM TEMPERATURE

International Electrotechnical Committee

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Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms and symbols
4 Test piece
5 Test principle and test apparatus
6 Test report
Annex A (informative) - Electromechanical relaxation
        test example of freestanding Au film

Abstract

Describes a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47