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SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 29: ELECTROMECHANICAL RELAXATION TEST METHOD FOR FREESTANDING CONDUCTIVE THIN-FILMS UNDER ROOM TEMPERATURE
International Electrotechnical Committee
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Availability date: 11/05/2021
FOREWORD
1 Scope
2 Normative references
3 Terms and symbols
4 Test piece
5 Test principle and test apparatus
6 Test report
Annex A (informative) - Electromechanical relaxation
test example of freestanding Au film
Describes a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |